Description
## FEI SEM component 20089-Q Product Overview
🔧 Product Overview
This FEI SEM component 20089-Q is an original FEI scanning electron microscope part removed from a professional working system.
It is a genuine dismantled unit removed from an FEI SEM system and intended for replacement, repair, or professional research equipment maintenance.
The component is structurally complete, professionally manufactured, and designed specifically for FEI scanning electron microscope platforms.
🔬 Main Features
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Original FEI Company assembly
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Model: 20089-Q
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Serial number: 092835-11255
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Industrial-grade SEM mechanical/vacuum component
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Precision metal structure with factory interfaces
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Stable, high-quality FEI workmanship
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Suitable for high-vacuum SEM environments
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Ideal for replacement, system restoration, or backup stock
🏭 Application Areas
This FEI SEM component is commonly used in:
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FEI scanning electron microscope systems
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Laboratory research equipment
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Semiconductor and materials science analysis
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Failure analysis and micro-inspection systems
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University and institutional SEM platforms
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Service engineers’ spare-parts inventory
📦 Condition Description
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Removed from professional equipment
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Normal signs of use
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No structural cracks or deformation
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Interfaces and fittings intact
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Approximately 80% cosmetic condition
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Not refurbished, not aftermarket, 100% original FEI part
(Recommended installation by experienced SEM service engineers.)
⚠ Important Notes
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This product is sold as an industrial scientific instrument component.
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Buyers should confirm compatibility with their FEI SEM model before purchase.
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Installation requires professional technical ability.
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What you see in the photos is the actual unit.
🚚 Packaging & Shipping
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Professionally packed for international transport
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Anti-shock + moisture protection
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Worldwide shipping available
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Combined shipping supported for multiple parts
If you are looking for a reliable original FEI SEM replacement part, Model 20089-Q is a solid choice for maintenance and system restoration.







