Description
The JEOL JSM-7600F is a high-performance Field Emission Scanning Electron Microscope (FE-SEM), equipped with a field emission gun (FEG) for ultra-high resolution imaging and a wide accelerating voltage range. This unit is pre-owned, professionally tested, and fully functional, supplied with control PC, monitors, and operation system, ready for immediate use.
Key Features:
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Model: JEOL JSM-7600F
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Electron Source: Field Emission Gun (FEG)
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Resolution: ~1.0 nm (at 15 kV), excellent performance even at low kV
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Magnification: 10× – 1,000,000×
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Accelerating Voltage: 0.1 – 30 kV
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Detectors: SE (Secondary Electron), BSE (Backscattered Electron)
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Stage: 5-axis motorized specimen stage for versatile observation
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Accessories: Control PC, monitors, operation console
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Applications: Material science, nanotechnology, semiconductor inspection, metal surface analysis, biological structure observation
Condition:
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Pre-owned, in good appearance
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Fully tested and functional
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Supplied with PC, monitors, control system
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SEM software installed and ready to use
Applications:
Ideal for research institutes, universities, and industrial labs requiring high-resolution analysis of nanostructures and complex surfaces.
