Description
The JEOL JSM-6510 is a reliable and widely used Scanning Electron Microscope (SEM) designed for high-resolution imaging of micro- and nano-scale surface structures. This unit is pre-owned, in good cosmetic condition, fully tested, and fully functional.
Key Features:
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Model: JEOL JSM-6510
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Magnification: 10× to 300,000×
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Resolution: ~3.0 nm (high vacuum mode)
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Accelerating Voltage: 0.3 – 30 kV
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Detectors: Standard SEI detector, optional BSE detector
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Vacuum System: Comes with ULVAC rotary vane vacuum pump
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Control System: Includes dedicated control PC, monitor, and software
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Applications: Material science research, semiconductor inspection, metal surface analysis, biological specimen observation
Condition:
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Pre-owned, good appearance
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Fully tested and functional
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Includes vacuum pump, control PC, monitor, and control panel
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Software installed: JEOL SEM Control Software
Applications:
Ideal for research institutes, universities, electronics industries, and laboratories focusing on material science and life sciences.
