Description
Product Description
The Bruker Dimension Edge Atomic Force Microscope (AFM) is a high-accuracy nanoscale imaging and measurement system widely used in semiconductor manufacturing, materials research, biology, micro-mechanics, and precision metrology.
This system provides exceptional resolution, stability, and scanning performance, making it one of Bruker’s most advanced AFM platforms.
The unit shown is in clean cosmetic condition, fully powered and operational, equipped with compatible system modules including the Contour GT-K Optical Profiling System (Model GTK1-11-1004).
1. Key Features
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✓ High-precision AFM for nanoscale imaging and surface analysis
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✓ Stable and accurate scanning performance
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✓ Suitable for semiconductor, materials, and micro-mechanical research
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✓ Supports multiple scan modes (contact, tapping, non-contact, etc.)
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✓ Professional laboratory configuration shown in photos
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✓ Includes Bruker Contour GT-K optical profiler controller (Model: GTK1-11-1004)
2. Technical Specifications
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Manufacturer: Bruker Corporation
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Model: Dimension Edge
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Profiling System: Contour GT-K Optical Profiling System
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Power Requirements (from label):
+5V / 10A
+12V / 5A
–12V / 1A
+24V / 2A
Full Load Power: 110W max -
Location: Tucson, Arizona, USA (Manufacturer location on label)
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Certification: TÜV, CE, EN 61010-1
3. Supported Applications
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Semiconductor wafer inspection
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Thin-film and nanostructure measurement
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Polymer and composite material analysis
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Microelectronics & MEMS characterization
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Life science and biological surface imaging
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Precision manufacturing metrology
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Optical surface roughness and 3D profiling
4. Included Items
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✓ Bruker Dimension Edge AFM (main instrument)
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✓ Contour GT-K Optical Profiling System (Model GTK1-11-1004)
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✓ Associated cables and power modules (as shown in photos)
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✓ Fully functional scanning head and controller
5. Condition Description
This Bruker AFM system is in good operational condition:
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Clean laboratory storage environment
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All ports and connectors intact
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System powers on normally
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Control modules respond correctly
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No major cosmetic damage
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Suitable for continued research or refurbishment
6. Test & Inspection Notes
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System powers on and passes initial self-check
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Optical profiling module responds to input
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Mechanical components appear intact
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Additional measurement calibration may be required by end-user
(Photos included show actual unit condition.)
7. Why Choose This Bruker AFM
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High-value instrument at a fraction of the new system cost
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Suitable for professional laboratories and university research
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Bruker is an industry leader in nanoscale metrology
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Excellent for upgrading existing research capabilities
End of Description
